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Special Test Kits
Application specific kits are available for many parameters including Arsenic, Water in Oil, Sulfate, Glycol and others. These kits use different methods, such as test strips, turbidity, and visual color changes.
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Test System
4003 TLP+™
The Model 4002 TLP+™ test system was the first turn-key commercial TLP developed for the ESD industry and has remained the leader in the ESD square pulse testing field since this method was first introduced in 1989. This tester is the ultimate design and analysis tool for ESD protection circuits. It provides Pulse Curve Traces of circuit characteristics which simulate ESD tests. This allows you to see into a chip’s operation taking out the guesswork which speeds your design and minimizes lost time.
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Test Automation Platform
Askida CT
Askida CT changes the way automated tests are carried out. It is the only platform on the market that lets you do true end-to-end testing automation without requiring deep technical skills. You can easily define your testing strategy and convert your manual tests into automated ones in one simple click.
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Solar Test Systems
AMETEK Scientific Instruments manufactures a range of application specific XM (Xtreme Measurement) products focused on solar cell / photovoltaic research (developed in collaboration with Professor Laurie Peter of the University of Bath, UK). These products are so versatile that they can also be used for photoelectrochemical (PEC) water splitting applications; and make use of Solartron’s unique high performance XM specified potentiostats and frequency response analyzers to provide a full complement of techniques for research into energy, corrosion and analytical electrochemistry.
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FPC Test Connectors
FPC Test Connectors (Clip Connectors) can easily be inserted and can be used for repeat testing, saving time and money as well as minimizing damage.
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Test Handler
HA1200
The new HA1200 handler can be linked with a tester to utilize our unique active thermal control technology for testing singulated and/or partially assembled dies. This technology enables testing of powerful high-end SoCs with 100% test coverage. This helps reduce yield loss at final test, thus reducing losses of final multi-die assembled products.
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Ethernet Switch
VPX6-6902
Curtiss-Wright Defense Solutions
The VPX6-6902 is a combined management, control and dataplane switch for small, mid-size and large 6U VPX systems. Supporting a centralized switch architecture in both star and dual-star topologies, the VPX6-6902 is available with Serial RapidIO (SRIO) switching alone, or with both SRIO dataplane and Ethernet mangement/control plane switching all in a single VPX slot.
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Optics Test Systems
IR Autocollimator
Optik Elektronik Gerätetechnik GmbH
The infrared autocollimator was specially designed for the 1550 nm wavelength range. In conjunction with the CROSDETECT evaluation software, it achieves a measuring accuracy of 1 arcsec with a resolution of 0.1 arcsec. The camera used is suitable for the wavelength range from 900 nm to 1700 nm.
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Reverse Test Probe
I-Stop
The I-Stop Reverse Test Probe is a test accessory designed for use with most signal level meters and with the Trilithic 9580 Return Maintenance System. Screw the probe into a distribution tap's unused KS port and a spring-loaded "stinger" connects a 20 dB resistive test point circuit to the hardline.
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Parrot Test Kits
Parrot clip - metal tip & double metal connection, suitable for multimeter probes
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Test Contactor/Probe Head
xWave
Highest performance and most robust RF broadband production solution for package, wafer, or Over-the-Air (OTA) test for 100 GHz.The xWave™ test contactor / probe head utilizes patented hybrid contacting technology to optimize RF performance and provide robustness for production testing of the most challenging cmWave and mmWave devices. Inside the xWave test contactor / probe head are embedded patch antennas and coplanar waveguides for both wireless and wired communication.
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Altitude Test Chamber
Environmental adaptability and reliability test for the instruments and meters, electrical products, materials, spare parts, equipments, etc at a low pressure, high temperature, low temperature, under the effect of single factor or multiple factors at the same time. Test for electric performance parameters of the specimen. Mainly used in aviation, aerospace, information, electronics and other industries.
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RF/Microwave Test Capability
Teledyne Labtech have extensive microwave alignment and microwave testing facilities. This includes the ability to test noise figure, S-parameters and harmonics. This ensures that Teledyne Labtech can supply a fully compliant product and provide a complete turnkey microwave assembly and test solution.
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Thermal Test Chip
Thermal Engineering Associates, Inc.
Thermal Test Chips (TTC) are used in many different Applications: Package Thermal Characterization, Heat Source Simulator, Temperature Reference Platform, Transient Analysis, System Thermal Management Design, Thermal Interface Material (TIM) Measurement & Characterization, Heat Sink Measurement & Characterization.
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Camera Test Suite
I-SITE
The I-SITE system is designed to provide measurements at multiple points in the signal processing chain for many types of camera systems. I-SITE can be expanded to accommodate multiple measurements and can be upgraded to incorporate additional modules as the user's system requirements change. There are many options that may be employed; thus there is no single I-SITE setup. Sources, detectors, and intermediate optics may all be configured to your requirements, and several different analysis options are offered.
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Test Program Modules
The BRAT Test Program developed will provide functional validation of an assembly based on customer supplied documentation. This does not include hardware (e.g., Interface Test Adaptors), documentation (e.g., technical orders), travel or travel related per diem, or site verification test or installation.
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Extendible Test Leads
The Extendable Tip Probe permits testing in those hard to reach areas. The tips are fully insulated with durable Kynar. This prevents accidental shorting of adjacent components. The tip is stainless steel and is very sharp, allowing for penetration of conformal coatings. The rubber lead is 18 gauge, 48" long.
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Test Executive Software
Enerchron
Enerchron is a powerful but easy to use test executive created for battery testing to simplify and accelerate your test automation. It’s a comprehensive battery test environment that includes integration with H/W and S/W tools. Enerchron is your shortest path to market.
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Test Suite
IEC 61850
The Test Suite is a group of Windows application that support IEC 61850 as well as IEC 60870-6 (TASE.2/ ICCP). New InSight functionality allows creation of custom graphical displays and scripted simulation design/debug via flowchart GUI. The Test Suite is comprised of three separate products.
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Copper Test Solution
DSX CableAnalyzer™ Series
The DSX CableAnalyzer Series copper test solution enables testing and certification of twisted pair cabling for up to 40 Gigabit Ethernet deployments and will handle any cabling system whether it is a Cat 5e, 6, 6A, 8 or Class FA and I/II. Certifying a cable is one part of a process that starts with system design and ends with system acceptance. The faster that process goes, the more profitable you'll be. Unfortunately, there are a lot of things that slow the process down setting up the tester ...show more -
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Test tools
Try our low-cost RF sniffers for fast and easy troubleshooting of unwanted interference caused by electromagnetic radiation sources in your local environment.
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Semiconductor Test Platform
PAx
PAx semiconductor test system delivers uncompromised RF performance in a low-cost system for testing RF power amplifiers and front-end modules for next-generation wireless standards.
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Ozone Test Chamber
EKT-2001OZ-HCLSX
Designed and manufactured in accordance with ASTM D1149, ISO1431 & JIS K6259 standards. Providing precise and accurate ozone (OZ) concentration environment for rubber and polymer test. Widely applied to (1) Accelerated ageing research (2) Quality control and assurance tests and (3) R&D laboratory formula experiments for cracking resistance.
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Test Systems
In-Circuit Test (ICT) tests populated circuit boards by means of electronic measurements through thin needles on test fixtures. We offer in-circuit testers for various testing strategies – from the flexible 19“ rack to the ergonomic high-performance tester. And all of our in-circuit testers are also available in the Lambda edition for true parallel testing. The flying probe test checks your printed circuit boards using four movable test heads. This requires no fixtures and allows for flexible test program generation. That makes our flying probe test systems ideal for a high mix of printed circuit boards and small to medium test volumes, such as for prototype testing.
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Emulation & Test Interface
Solder down modules to suit any package type provides a cost effective solution for replacement test heads, male or female. The mating top modules can incorporate either a ZIF or standard IC socket and the addition of optional test pins if required from RS Components.
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Multimeter and Cable Test
ZHANGZHOU HUAYI ELECTRONICS CO.,LTD.
To test whether there is a complete electrical connection between two points.
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Battery Test Equipment
Shenzhen Bonad Instrument Co., Ltd.
The tests that can be performed by lithium-ion battery safety testing equipment include temperature cycling test, thermal abuse test, high altitude low-pressure simulation test, vibration test, shock test, external short-circuit test, forced internal short-circuit test, drop test, crush test, impact test, nail penetration test, burning test, etc. These test items mainly apply to various lithium-ion cells such as 18650 cells and prismatic cells, lithium-ion batteries, lithium-ion battery modules,...show more -
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Test Hardware
TTPSimulate PCI
TTPSimulate supports hardware-in-the-loop simulation and design of complex distributed control systems where some parts of the systems are physically available and others exist only as a simulation model. This board enables concurrent engineering and reliable integration of complex integrated systems in large programs.
